Abstract In recent years, semiconductors, electronics, optics, and various other industries have seen a significant surge in the use of sapphire materials, driven by their exceptional mechanical and chemical properties. The machining of sapphire surfaces plays a crucial role in all these applications. However, due to sapphires’ exceptionally high hardness (Mohs hardness of 9, Vickers hardness of 2300) and brittleness, machining them often presents challenges such as microcracking and chipping of the workpiece, as well as significant tool wear, making sapphires difficult to cut. To enhance the machining efficiency and machined surface integrity, ultrasonic vibration-assisted (UV-A) machining of sapphire has already been studied, showing improved performance with lower cutting force, better surface finish, and extended tool life. Scribing tests using a single-diamond tool not only are an effective method to understand the material removal mechanism and deformation characteristics during such UV-A machining processes but also can be used as a potential process for separating IC chips from wafers. This paper presents a comprehensive study of the UV-A scribing process, aiming to develop an understanding of sapphire’s material removal mechanism under varying ultrasonic power levels and cutting tool geometries. In this experimental investigation, the effect of five different levels of ultrasonic power and three different cutting tool tip angles at various feeding depths on the scribe-induced features of the sapphire surface has been presented with a quantitative and qualitative comparison. The findings indicate that at feeding depths less than 6 μm, UV-A scribing with 40–80% ultrasonic power can reduce cutting force up to 50% and thus improve scribe quality. However, between feeding depths of 6 to 10 μm, this advantage of using ultrasonic vibration gradually diminishes. Additionally, UV-A scribing with a smaller tool tip angle (60°) was found to lower cutting force by 65% and improve scribe quality, effectively inhibiting residual stress formation and microcrack propagation. Furthermore, UV-A scribing also facilitated higher critical feeding depths at around 10 μm, compared to 6 μm in conventional scribing.
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Analysis and Design of Capacitive Parametric Ultrasonic Transducers for Efficient Ultrasonic Power Transfer Based on a 1-D Lumped Model
- PAR ID:
- 10093706
- Publisher / Repository:
- IEEE
- Date Published:
- Journal Name:
- IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
- Volume:
- 65
- Issue:
- 11
- ISSN:
- 0885-3010
- Page Range / eLocation ID:
- 2103 to 2112
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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