Xiao, Rui, Hou, Yasen, Law, Matt, and Yu, Dong. On the Use of Photocurrent Imaging To Determine Carrier Diffusion Lengths in Nanostructured Thin-Film Field-Effect Transistors. Retrieved from https://par.nsf.gov/biblio/10095654. The Journal of Physical Chemistry C 122.32 Web. doi:10.1021/acs.jpcc.8b06734.

Xiao, Rui, Hou, Yasen, Law, Matt, & Yu, Dong. On the Use of Photocurrent Imaging To Determine Carrier Diffusion Lengths in Nanostructured Thin-Film Field-Effect Transistors. The Journal of Physical Chemistry C, 122 (32). Retrieved from https://par.nsf.gov/biblio/10095654. https://doi.org/10.1021/acs.jpcc.8b06734

Xiao, Rui, Hou, Yasen, Law, Matt, and Yu, Dong. "On the Use of Photocurrent Imaging To Determine Carrier Diffusion Lengths in Nanostructured Thin-Film Field-Effect Transistors". The Journal of Physical Chemistry C 122 (32). Country unknown/Code not available. https://doi.org/10.1021/acs.jpcc.8b06734. https://par.nsf.gov/biblio/10095654.

@article{osti_10095654,
place = {Country unknown/Code not available}, title = {On the Use of Photocurrent Imaging To Determine Carrier Diffusion Lengths in Nanostructured Thin-Film Field-Effect Transistors}, url = {https://par.nsf.gov/biblio/10095654}, DOI = {10.1021/acs.jpcc.8b06734}, abstractNote = {}, journal = {The Journal of Physical Chemistry C}, volume = {122}, number = {32}, author = {Xiao, Rui and Hou, Yasen and Law, Matt and Yu, Dong}, }