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Title: A Bayesian approach to sequential monitoring of nonlinear profiles using wavelets: Wavelet-Based Bayesian Profile Monitoring
Award ID(s):
1712870 1907316
NSF-PAR ID:
10097141
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
Quality and Reliability Engineering International
Volume:
35
Issue:
3
ISSN:
0748-8017
Page Range / eLocation ID:
761 to 775
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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