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Title: Electrical characterization of process induced effects on non-silicon devices
Award ID(s):
1653343
PAR ID:
10098818
Author(s) / Creator(s):
; ; ; ; ; ; ; ;
Date Published:
Journal Name:
2018 International Conference on IC Design & Technology (ICICDT)
Page Range / eLocation ID:
173 to 176
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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