Young, Chadwin D., Bolshakov, Pavel, Rodriguez-Davila, Rodolfo A., Zhao, Peng, Khosravi, Ava, Mejia, Israel, Quevedo-Lopez, Manuel, Hinkle, Christopher L., and Wallace, Robert M. Electrical characterization of process induced effects on non-silicon devices. Retrieved from https://par.nsf.gov/biblio/10098818. 2018 International Conference on IC Design & Technology (ICICDT) . Web. doi:10.1109/ICICDT.2018.8399784.

Young, Chadwin D., Bolshakov, Pavel, Rodriguez-Davila, Rodolfo A., Zhao, Peng, Khosravi, Ava, Mejia, Israel, Quevedo-Lopez, Manuel, Hinkle, Christopher L., & Wallace, Robert M. Electrical characterization of process induced effects on non-silicon devices. 2018 International Conference on IC Design & Technology (ICICDT), (). Retrieved from https://par.nsf.gov/biblio/10098818. https://doi.org/10.1109/ICICDT.2018.8399784

Young, Chadwin D., Bolshakov, Pavel, Rodriguez-Davila, Rodolfo A., Zhao, Peng, Khosravi, Ava, Mejia, Israel, Quevedo-Lopez, Manuel, Hinkle, Christopher L., and Wallace, Robert M. "Electrical characterization of process induced effects on non-silicon devices". 2018 International Conference on IC Design & Technology (ICICDT) (). Country unknown/Code not available. https://doi.org/10.1109/ICICDT.2018.8399784. https://par.nsf.gov/biblio/10098818.

@article{osti_10098818,
place = {Country unknown/Code not available}, title = {Electrical characterization of process induced effects on non-silicon devices}, url = {https://par.nsf.gov/biblio/10098818}, DOI = {10.1109/ICICDT.2018.8399784}, abstractNote = {}, journal = {2018 International Conference on IC Design & Technology (ICICDT)}, author = {Young, Chadwin D. and Bolshakov, Pavel and Rodriguez-Davila, Rodolfo A. and Zhao, Peng and Khosravi, Ava and Mejia, Israel and Quevedo-Lopez, Manuel and Hinkle, Christopher L. and Wallace, Robert M.}, }