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Title: Semiparametric Models for Accelerated Destructive Degradation Test Data Analysis
Award ID(s):
1634867
NSF-PAR ID:
10110339
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
Technometrics
Volume:
60
Issue:
2
ISSN:
0040-1706
Page Range / eLocation ID:
222 to 234
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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