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Title: Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation
This study examines the single-event response of Xilinx 16nm FinFET UltraScale+ FPGA and MPSoC device families. Heavy-ion single-event latch-up, single-event upsets in configuration SRAM, BlockRAM™ memories, and flip-flops, and neutron-induced single-event latch-up results are provided.  more » « less
Award ID(s):
1738550
PAR ID:
10110500
Author(s) / Creator(s):
; ; ; ; ; ; ;
Date Published:
Journal Name:
Radiation Effects Data, IEEE Workshop
Page Range / eLocation ID:
1 to 8
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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