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Title: Reliability Analysis of Large Intelligent Surfaces (LISs): Rate Distribution and Outage Probability
Award ID(s):
1836802 1638283
NSF-PAR ID:
10116557
Author(s) / Creator(s):
; ; ; ;
Date Published:
Journal Name:
IEEE Wireless Communications Letters
ISSN:
2162-2337
Page Range / eLocation ID:
1 to 1
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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