Li, Z., Cen, W.R., Robinson, A., Moore, D.C., Wen, L.J., Odian, A., Kharusi, S. Al, Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P.S., Beck, D., Belov, V., Bhatta, T., Brodsky, J.P., Brown, E., Brunner, T., Caden, E., Cao, G.F., Cao, L., Chambers, C., Chana, B., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S.J., Croix, A. De, Mesrobian-Kabakian, A. Der, DeVoe, R., Vacri, M.L. Di, Dilling, J., Ding, Y.Y., Dolinski, M.J., Dragone, A., Echevers, J., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fontaine, R., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E.V., Heffner, M., Hoppe, E.W., Hößl, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M.J., Jiang, X.S., Karelin, A., Kaufman, L.J., Kodroff, D., Koffas, T., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Larson, A., Leach, K.G., Lenardo, B.G., Leonard, D.S., Li, G., Li, S., Licciardi, C., Lin, Y.H., Lv, P., MacLellan, R., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Murray, K., Nakarmi, P., Natzke, C.R., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Oriunno, M., Orrell, J.L., Ortega, G.S., Ostrovskiy, I., Overman, C.T., Parent, S., Piepke, A., Pocar, A., Pratte, J.-F., Radeka, V., Raguzin, E., Rescia, S., Retière, F., Richman, M., Rossignol, T., Rowson, P.C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., VIII, K. Skarpaas, Soma, A.K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X.L., Tarka, M., Todd, J., Tolba, T., Totev, T.I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J.-L., Wagenpfeil, M., Walent, M., Wang, Q., Ward, M., Watkins, J., Weber, M., Wei, W., Wichoski, U., Wu, S.X., Wu, W.H., Wu, X., Xia, Q., Yang, H., Yang, L., Yen, Y.-R., Zeldovich, O., Zhao, J., Zhou, Y., and Ziegler, T. Simulation of charge readout with segmented tiles in nEXO. Retrieved from https://par.nsf.gov/biblio/10119062. Journal of Instrumentation 14.09 Web. doi:10.1088/1748-0221/14/09/P09020.

Li, Z., Cen, W.R., Robinson, A., Moore, D.C., Wen, L.J., Odian, A., Kharusi, S. Al, Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P.S., Beck, D., Belov, V., Bhatta, T., Brodsky, J.P., Brown, E., Brunner, T., Caden, E., Cao, G.F., Cao, L., Chambers, C., Chana, B., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S.J., Croix, A. De, Mesrobian-Kabakian, A. Der, DeVoe, R., Vacri, M.L. Di, Dilling, J., Ding, Y.Y., Dolinski, M.J., Dragone, A., Echevers, J., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fontaine, R., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E.V., Heffner, M., Hoppe, E.W., Hößl, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M.J., Jiang, X.S., Karelin, A., Kaufman, L.J., Kodroff, D., Koffas, T., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Larson, A., Leach, K.G., Lenardo, B.G., Leonard, D.S., Li, G., Li, S., Licciardi, C., Lin, Y.H., Lv, P., MacLellan, R., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Murray, K., Nakarmi, P., Natzke, C.R., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Oriunno, M., Orrell, J.L., Ortega, G.S., Ostrovskiy, I., Overman, C.T., Parent, S., Piepke, A., Pocar, A., Pratte, J.-F., Radeka, V., Raguzin, E., Rescia, S., Retière, F., Richman, M., Rossignol, T., Rowson, P.C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., VIII, K. Skarpaas, Soma, A.K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X.L., Tarka, M., Todd, J., Tolba, T., Totev, T.I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J.-L., Wagenpfeil, M., Walent, M., Wang, Q., Ward, M., Watkins, J., Weber, M., Wei, W., Wichoski, U., Wu, S.X., Wu, W.H., Wu, X., Xia, Q., Yang, H., Yang, L., Yen, Y.-R., Zeldovich, O., Zhao, J., Zhou, Y., & Ziegler, T. Simulation of charge readout with segmented tiles in nEXO. Journal of Instrumentation, 14 (09). Retrieved from https://par.nsf.gov/biblio/10119062. https://doi.org/10.1088/1748-0221/14/09/P09020

Li, Z., Cen, W.R., Robinson, A., Moore, D.C., Wen, L.J., Odian, A., Kharusi, S. Al, Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P.S., Beck, D., Belov, V., Bhatta, T., Brodsky, J.P., Brown, E., Brunner, T., Caden, E., Cao, G.F., Cao, L., Chambers, C., Chana, B., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., Daugherty, S.J., Croix, A. De, Mesrobian-Kabakian, A. Der, DeVoe, R., Vacri, M.L. Di, Dilling, J., Ding, Y.Y., Dolinski, M.J., Dragone, A., Echevers, J., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fontaine, R., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E.V., Heffner, M., Hoppe, E.W., Hößl, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M.J., Jiang, X.S., Karelin, A., Kaufman, L.J., Kodroff, D., Koffas, T., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Larson, A., Leach, K.G., Lenardo, B.G., Leonard, D.S., Li, G., Li, S., Licciardi, C., Lin, Y.H., Lv, P., MacLellan, R., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Murray, K., Nakarmi, P., Natzke, C.R., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Oriunno, M., Orrell, J.L., Ortega, G.S., Ostrovskiy, I., Overman, C.T., Parent, S., Piepke, A., Pocar, A., Pratte, J.-F., Radeka, V., Raguzin, E., Rescia, S., Retière, F., Richman, M., Rossignol, T., Rowson, P.C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., VIII, K. Skarpaas, Soma, A.K., St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X.L., Tarka, M., Todd, J., Tolba, T., Totev, T.I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J.-L., Wagenpfeil, M., Walent, M., Wang, Q., Ward, M., Watkins, J., Weber, M., Wei, W., Wichoski, U., Wu, S.X., Wu, W.H., Wu, X., Xia, Q., Yang, H., Yang, L., Yen, Y.-R., Zeldovich, O., Zhao, J., Zhou, Y., and Ziegler, T. "Simulation of charge readout with segmented tiles in nEXO". Journal of Instrumentation 14 (09). Country unknown/Code not available. https://doi.org/10.1088/1748-0221/14/09/P09020. https://par.nsf.gov/biblio/10119062.

@article{osti_10119062,
place = {Country unknown/Code not available}, title = {Simulation of charge readout with segmented tiles in nEXO}, url = {https://par.nsf.gov/biblio/10119062}, DOI = {10.1088/1748-0221/14/09/P09020}, abstractNote = {}, journal = {Journal of Instrumentation}, volume = {14}, number = {09}, author = {Li, Z. and Cen, W.R. and Robinson, A. and Moore, D.C. and Wen, L.J. and Odian, A. and Kharusi, S. Al and Anton, G. and Arnquist, I.J. and Badhrees, I. and Barbeau, P.S. and Beck, D. and Belov, V. and Bhatta, T. and Brodsky, J.P. and Brown, E. and Brunner, T. and Caden, E. and Cao, G.F. and Cao, L. and Chambers, C. and Chana, B. and Charlebois, S.A. and Chiu, M. and Cleveland, B. and Coon, M. and Craycraft, A. and Dalmasson, J. and Daniels, T. and Darroch, L. and Daugherty, S.J. and Croix, A. De and Mesrobian-Kabakian, A. Der and DeVoe, R. and Vacri, M.L. Di and Dilling, J. and Ding, Y.Y. and Dolinski, M.J. and Dragone, A. and Echevers, J. and Elbeltagi, M. and Fabris, L. and Fairbank, D. and Fairbank, W. and Farine, J. and Ferrara, S. and Feyzbakhsh, S. and Fontaine, R. and Fucarino, A. and Gallina, G. and Gautam, P. and Giacomini, G. and Goeldi, D. and Gornea, R. and Gratta, G. and Hansen, E.V. and Heffner, M. and Hoppe, E.W. and Hößl, J. and House, A. and Hughes, M. and Iverson, A. and Jamil, A. and Jewell, M.J. and Jiang, X.S. and Karelin, A. and Kaufman, L.J. and Kodroff, D. and Koffas, T. and Krücken, R. and Kuchenkov, A. and Kumar, K.S. and Lan, Y. and Larson, A. and Leach, K.G. and Lenardo, B.G. and Leonard, D.S. and Li, G. and Li, S. and Licciardi, C. and Lin, Y.H. and Lv, P. and MacLellan, R. and McElroy, T. and Medina-Peregrina, M. and Michel, T. and Mong, B. and Murray, K. and Nakarmi, P. and Natzke, C.R. and Newby, R.J. and Ning, Z. and Njoya, O. and Nolet, F. and Nusair, O. and Odgers, K. and Oriunno, M. and Orrell, J.L. and Ortega, G.S. and Ostrovskiy, I. and Overman, C.T. and Parent, S. and Piepke, A. and Pocar, A. and Pratte, J.-F. and Radeka, V. and Raguzin, E. and Rescia, S. and Retière, F. and Richman, M. and Rossignol, T. and Rowson, P.C. and Roy, N. and Runge, J. and Saldanha, R. and Sangiorgio, S. and VIII, K. Skarpaas and Soma, A.K. and St-Hilaire, G. and Stekhanov, V. and Stiegler, T. and Sun, X.L. and Tarka, M. and Todd, J. and Tolba, T. and Totev, T.I. and Tsang, R. and Tsang, T. and Vachon, F. and Veeraraghavan, V. and Viel, S. and Visser, G. and Vivo-Vilches, C. and Vuilleumier, J.-L. and Wagenpfeil, M. and Walent, M. and Wang, Q. and Ward, M. and Watkins, J. and Weber, M. and Wei, W. and Wichoski, U. and Wu, S.X. and Wu, W.H. and Wu, X. and Xia, Q. and Yang, H. and Yang, L. and Yen, Y.-R. and Zeldovich, O. and Zhao, J. and Zhou, Y. and Ziegler, T.}, }