Two-Pattern ∆IDDQ Test for Recycled IC Detection
- Award ID(s):
- 1755733
- Publication Date:
- NSF-PAR ID:
- 10137066
- Journal Name:
- 2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID)
- Page Range or eLocation-ID:
- 82 to 87
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Publisher's Version of Record
- https://doi.org/10.1109/VLSID.2019.00033
