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Title: Two-Pattern ∆IDDQ Test for Recycled IC Detection
Award ID(s):
1755733
NSF-PAR ID:
10137066
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID)
Page Range / eLocation ID:
82 to 87
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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