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Title: Cryogenic STEM Imaging and Spectroscopy of Electron Beam Sensitive Materials
Award ID(s):
1654596 1719875
PAR ID:
10142611
Author(s) / Creator(s):
; ; ;
Date Published:
Journal Name:
Microscopy and Microanalysis
Volume:
25
Issue:
S2
ISSN:
1431-9276
Page Range / eLocation ID:
1660 to 1661
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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