Modularity measures: Concepts, computation, and applications to manufacturing systems (Journal Article) | NSF PAGES

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Citation Details

Modularity measures: Concepts, computation, and applications to manufacturing systems

Award ID(s):: 1748516

NSF-PAR ID:: 10145100

Author(s) / Creator(s):: Shao, Yue; Zavala, Victor M.

Date Published:: 2020-03-17

Journal Name:: AIChE Journal

ISSN:: 0001-1541

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Journal Article:
https://doi.org/10.1002/aic.16965