Chen, Yaoxu, Wang, Huachun, Zhang, Yuan, Li, Rongfeng, Chen, Changhao, Zhang, Haitian, Tang, Shujun, Liu, Shengnan, Chen, Xian, Wu, Hui, Lv, Ruitao, Sheng, Xing, Zhang, Peijian, Wang, Shuodao, and Yin, Lan. Electrochemically triggered degradation of silicon membranes for smart on-demand transient electronic devices. Retrieved from https://par.nsf.gov/biblio/10157261. Nanotechnology 30.39 Web. doi:10.1088/1361-6528/ab2853.

Chen, Yaoxu, Wang, Huachun, Zhang, Yuan, Li, Rongfeng, Chen, Changhao, Zhang, Haitian, Tang, Shujun, Liu, Shengnan, Chen, Xian, Wu, Hui, Lv, Ruitao, Sheng, Xing, Zhang, Peijian, Wang, Shuodao, & Yin, Lan. Electrochemically triggered degradation of silicon membranes for smart on-demand transient electronic devices. Nanotechnology, 30 (39). Retrieved from https://par.nsf.gov/biblio/10157261. https://doi.org/10.1088/1361-6528/ab2853

Chen, Yaoxu, Wang, Huachun, Zhang, Yuan, Li, Rongfeng, Chen, Changhao, Zhang, Haitian, Tang, Shujun, Liu, Shengnan, Chen, Xian, Wu, Hui, Lv, Ruitao, Sheng, Xing, Zhang, Peijian, Wang, Shuodao, and Yin, Lan. "Electrochemically triggered degradation of silicon membranes for smart on-demand transient electronic devices". Nanotechnology 30 (39). Country unknown/Code not available. https://doi.org/10.1088/1361-6528/ab2853. https://par.nsf.gov/biblio/10157261.

@article{osti_10157261,
place = {Country unknown/Code not available}, title = {Electrochemically triggered degradation of silicon membranes for smart on-demand transient electronic devices}, url = {https://par.nsf.gov/biblio/10157261}, DOI = {10.1088/1361-6528/ab2853}, abstractNote = {}, journal = {Nanotechnology}, volume = {30}, number = {39}, author = {Chen, Yaoxu and Wang, Huachun and Zhang, Yuan and Li, Rongfeng and Chen, Changhao and Zhang, Haitian and Tang, Shujun and Liu, Shengnan and Chen, Xian and Wu, Hui and Lv, Ruitao and Sheng, Xing and Zhang, Peijian and Wang, Shuodao and Yin, Lan}, }