Abstract Quantum state discrimination is a central problem in quantum measurement theory, with applications spanning from quantum communication to computation. Typical measurement paradigms for state discrimination involve a minimum probability of error or unambiguous discrimination with a minimum probability of inconclusive results. Alternatively, an optimal inconclusive measurement, a non-projective measurement, achieves minimal error for a given inconclusive probability. This more general measurement encompasses the standard measurement paradigms for state discrimination and provides a much more powerful tool for quantum information and communication. Here, we experimentally demonstrate the optimal inconclusive measurement for the discrimination of binary coherent states using linear optics and single-photon detection. Our demonstration uses coherent displacement operations based on interference, single-photon detection, and fast feedback to prepare the optimal feedback policy for the optimal non-projective quantum measurement with high fidelity. This generalized measurement allows us to transition among standard measurement paradigms in an optimal way from minimum error to unambiguous measurements for binary coherent states. As a particular case, we use this general measurement to implement the optimal minimum error measurement for phase-coherent states, which is the optimal modulation for communications under the average power constraint. Moreover, we propose a hybrid measurement that leverages the binary optimal inconclusive measurement in conjunction with sequential, unambiguous state elimination to realize higher dimensional inconclusive measurements of coherent states.
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Quadratic extension to retrace error calibration algorithm for non-null interferometric surface figure testing of nominally flat reflective surfaces
We present a slope dependent calibration algorithm for interferometric surface figure testing. RMS wavefront error is reduced 40.7% (10.8% for linear method) from the uncalibrated measurement for a R/22.7 mirror tested against a flat reference. © 2019 The Author(s) OCIS codes: 110.0110 Imaging systems; 120.0120 Instrumentation, measurement, and metrology
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- PAR ID:
- 10161263
- Date Published:
- Journal Name:
- Design and Fabrication Congress 2019 (Freeform, OFT) © OSA 2019
- Volume:
- JW3A.7
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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