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Title: Temperature overshoot as the cause of physical changes in resistive switching devices during electro-formation
Award ID(s):
1905648
NSF-PAR ID:
10162902
Author(s) / Creator(s):
 ;  ;  ;  ;  ;  
Publisher / Repository:
American Institute of Physics
Date Published:
Journal Name:
Journal of Applied Physics
Volume:
127
Issue:
23
ISSN:
0021-8979
Page Range / eLocation ID:
Article No. 235107
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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