Causal Testing: Understanding Defects' Root Causes (Journal Article) | NSF PAGES

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Citation Details

Causal Testing: Understanding Defects' Root Causes

Authors:: Johnson, Brittany; Brun, Yuriy; Meliou, Alexandra

Award ID(s):: 1453543 1763423 1453474

Publication Date:: 2020-01-01

NSF-PAR ID:: 10172482

Journal Name:: Proceedings of the 42nd International Conference on Software Engineering (ICSE)

Page Range or eLocation-ID:: 87-99

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Publisher's Version of Record
https://doi.org/10.1145/3377811.3380377