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Title: Causal Testing: Understanding Defects' Root Causes
Award ID(s):
1453543 1763423 1453474
NSF-PAR ID:
10172482
Author(s) / Creator(s):
; ;
Date Published:
Journal Name:
Proceedings of the 42nd International Conference on Software Engineering (ICSE)
Page Range / eLocation ID:
87-99
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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