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Title: Causal Testing: Understanding Defects' Root Causes
Authors:
; ;
Award ID(s):
1453543 1763423 1453474
Publication Date:
NSF-PAR ID:
10172482
Journal Name:
Proceedings of the 42nd International Conference on Software Engineering (ICSE)
Page Range or eLocation-ID:
87-99
Sponsoring Org:
National Science Foundation
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