Slicer, Shayna M., Luo, Charles Q., Luo, Zhiping, Yeung, Sharon C., McGinn, Paul J., and Miller, Dean J. Identification of Chemical Dopants in YBa2Cu3O7-δ by Electron Probe Microanalyzer. Retrieved from https://par.nsf.gov/biblio/10172655. Microscopy and Microanalysis 24.S1 Web. doi:10.1017/S1431927618000727.

Slicer, Shayna M., Luo, Charles Q., Luo, Zhiping, Yeung, Sharon C., McGinn, Paul J., & Miller, Dean J. Identification of Chemical Dopants in YBa2Cu3O7-δ by Electron Probe Microanalyzer. Microscopy and Microanalysis, 24 (S1). Retrieved from https://par.nsf.gov/biblio/10172655. https://doi.org/10.1017/S1431927618000727

Slicer, Shayna M., Luo, Charles Q., Luo, Zhiping, Yeung, Sharon C., McGinn, Paul J., and Miller, Dean J. "Identification of Chemical Dopants in YBa2Cu3O7-δ by Electron Probe Microanalyzer". Microscopy and Microanalysis 24 (S1). Country unknown/Code not available. https://doi.org/10.1017/S1431927618000727. https://par.nsf.gov/biblio/10172655.

@article{osti_10172655,
place = {Country unknown/Code not available}, title = {Identification of Chemical Dopants in YBa2Cu3O7-δ by Electron Probe Microanalyzer}, url = {https://par.nsf.gov/biblio/10172655}, DOI = {10.1017/S1431927618000727}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {24}, number = {S1}, author = {Slicer, Shayna M. and Luo, Charles Q. and Luo, Zhiping and Yeung, Sharon C. and McGinn, Paul J. and Miller, Dean J.}, }