Shin, Dongyeob, Choi, Wonseok, Park, Jongsun, and Ghosh, Swaroop. Sensitivity-Based Error Resilient Techniques With Heterogeneous Multiply–Accumulate Unit for Voltage Scalable Deep Neural Network Accelerators. Retrieved from https://par.nsf.gov/biblio/10174891. IEEE Journal on Emerging and Selected Topics in Circuits and Systems 9.3 Web. doi:10.1109/JETCAS.2019.2933862.

Shin, Dongyeob, Choi, Wonseok, Park, Jongsun, & Ghosh, Swaroop. Sensitivity-Based Error Resilient Techniques With Heterogeneous Multiply–Accumulate Unit for Voltage Scalable Deep Neural Network Accelerators. IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 9 (3). Retrieved from https://par.nsf.gov/biblio/10174891. https://doi.org/10.1109/JETCAS.2019.2933862

Shin, Dongyeob, Choi, Wonseok, Park, Jongsun, and Ghosh, Swaroop. "Sensitivity-Based Error Resilient Techniques With Heterogeneous Multiply–Accumulate Unit for Voltage Scalable Deep Neural Network Accelerators". IEEE Journal on Emerging and Selected Topics in Circuits and Systems 9 (3). Country unknown/Code not available. https://doi.org/10.1109/JETCAS.2019.2933862. https://par.nsf.gov/biblio/10174891.

@article{osti_10174891,
place = {Country unknown/Code not available}, title = {Sensitivity-Based Error Resilient Techniques With Heterogeneous Multiply–Accumulate Unit for Voltage Scalable Deep Neural Network Accelerators}, url = {https://par.nsf.gov/biblio/10174891}, DOI = {10.1109/JETCAS.2019.2933862}, abstractNote = {}, journal = {IEEE Journal on Emerging and Selected Topics in Circuits and Systems}, volume = {9}, number = {3}, author = {Shin, Dongyeob and Choi, Wonseok and Park, Jongsun and Ghosh, Swaroop}, }