Chen, Yi, Li, Haijun, Qiu, Zhen, Wang, Thomas D., and Oldham, Kenn R. Improved Extended Kalman Filter Estimation Using Threshold Signal Detection With an MEMS Electrostatic Microscanner. Retrieved from https://par.nsf.gov/biblio/10177027. IEEE Transactions on Industrial Electronics 67.2 Web. doi:10.1109/TIE.2019.2901663.

Chen, Yi, Li, Haijun, Qiu, Zhen, Wang, Thomas D., & Oldham, Kenn R. Improved Extended Kalman Filter Estimation Using Threshold Signal Detection With an MEMS Electrostatic Microscanner. IEEE Transactions on Industrial Electronics, 67 (2). Retrieved from https://par.nsf.gov/biblio/10177027. https://doi.org/10.1109/TIE.2019.2901663

Chen, Yi, Li, Haijun, Qiu, Zhen, Wang, Thomas D., and Oldham, Kenn R. "Improved Extended Kalman Filter Estimation Using Threshold Signal Detection With an MEMS Electrostatic Microscanner". IEEE Transactions on Industrial Electronics 67 (2). Country unknown/Code not available. https://doi.org/10.1109/TIE.2019.2901663. https://par.nsf.gov/biblio/10177027.

@article{osti_10177027,
place = {Country unknown/Code not available}, title = {Improved Extended Kalman Filter Estimation Using Threshold Signal Detection With an MEMS Electrostatic Microscanner}, url = {https://par.nsf.gov/biblio/10177027}, DOI = {10.1109/TIE.2019.2901663}, abstractNote = {}, journal = {IEEE Transactions on Industrial Electronics}, volume = {67}, number = {2}, author = {Chen, Yi and Li, Haijun and Qiu, Zhen and Wang, Thomas D. and Oldham, Kenn R.}, }