Wang, Chenyu, Li, Xiaona, Li, Zhumin, Wang, Qing, Zheng, Yuehong, Ma, Yue, Bi, Linxia, Zhang, Yuanyuan, Yuan, Xihui, Zhang, Xin, Dong, Chuang, and Liaw, Peter K. The resistivity–temperature behavior of Al CoCrFeNi high-entropy alloy films. Retrieved from https://par.nsf.gov/biblio/10179083. Thin Solid Films 700.C Web. doi:10.1016/j.tsf.2020.137895.

Wang, Chenyu, Li, Xiaona, Li, Zhumin, Wang, Qing, Zheng, Yuehong, Ma, Yue, Bi, Linxia, Zhang, Yuanyuan, Yuan, Xihui, Zhang, Xin, Dong, Chuang, & Liaw, Peter K. The resistivity–temperature behavior of Al CoCrFeNi high-entropy alloy films. Thin Solid Films, 700 (C). Retrieved from https://par.nsf.gov/biblio/10179083. https://doi.org/10.1016/j.tsf.2020.137895

Wang, Chenyu, Li, Xiaona, Li, Zhumin, Wang, Qing, Zheng, Yuehong, Ma, Yue, Bi, Linxia, Zhang, Yuanyuan, Yuan, Xihui, Zhang, Xin, Dong, Chuang, and Liaw, Peter K. "The resistivity–temperature behavior of Al CoCrFeNi high-entropy alloy films". Thin Solid Films 700 (C). Country unknown/Code not available. https://doi.org/10.1016/j.tsf.2020.137895. https://par.nsf.gov/biblio/10179083.

@article{osti_10179083,
place = {Country unknown/Code not available}, title = {The resistivity–temperature behavior of Al CoCrFeNi high-entropy alloy films}, url = {https://par.nsf.gov/biblio/10179083}, DOI = {10.1016/j.tsf.2020.137895}, abstractNote = {}, journal = {Thin Solid Films}, volume = {700}, number = {C}, author = {Wang, Chenyu and Li, Xiaona and Li, Zhumin and Wang, Qing and Zheng, Yuehong and Ma, Yue and Bi, Linxia and Zhang, Yuanyuan and Yuan, Xihui and Zhang, Xin and Dong, Chuang and Liaw, Peter K.}, }