- NSF Public Access
- Search Results
- Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon
Title:
Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon
- NSF-PAR ID:
- 10179915
- Author(s) / Creator(s):
- Nakarmi, P.; Ostrovskiy, I.; Soma, A.K.; Retière, F.; Kharusi, S. Al; Alfaris, M.; Anton, G.; Arnquist, I.J.; Badhrees, I.; Barbeau, P.S.; Beck, D.; Belov, V.; Bhatta, T.; Blatchford, J.; Breur, P.A.; Brodsky, J.P.; Brown, E.; Brunner, T.; Mamahit, S. Byrne; Caden, E.more » ; Cao, G.F.; Cao, L.; Chambers, C.; Chana, B.; Charlebois, S.A.; Chiu, M.; Cleveland, B.; Coon, M.; Craycraft, A.; Dalmasson, J.; Daniels, T.; Darroch, L.; Croix, A. De; Mesrobian-Kabakian, A. Der; DeVoe, R.; Vacri, M.L. Di; Dilling, J.; Ding, Y.Y.; Dolinski, M.J.; Doria, L.; Dragone, A.; Echevers, J.; Edaltafar, F.; Elbeltagi, M.; Fabris, L.; Fairbank, D.; Fairbank, W.; Farine, J.; Ferrara, S.; Feyzbakhsh, S.; Fontaine, R.; Fucarino, A.; Gallina, G.; Gautam, P.; Giacomini, G.; Goeldi, D.; Gornea, R.; Gratta, G.; Hansen, E.V.; Heffner, M.; Hoppe, E.W.; Hößl, J.; House, A.; Hughes, M.; Iverson, A.; Jamil, A.; Jewell, M.J.; Jiang, X.S.; Karelin, A.; Kaufman, L.J.; Koffas, T.; Krücken, R.; Kuchenkov, A.; Kumar, K.S.; Lan, Y.; Larson, A.; Leach, K.G.; Lenardo, B.G.; Leonard, D.S.; Li, G.; Li, S.; Li, Z.; Licciardi, C.; Lv, P.; MacLellan, R.; Massacret, N.; McElroy, T.; Medina-Peregrina, M.; Michel, T.; Mong, B.; Moore, D.C.; Murray, K.; Natzke, C.R.; Newby, R.J.; Ning, Z.; Njoya, O.; Nolet, F.; Nusair, O.; Odgers, K.; Odian, A.; Oriunno, M.; Orrell, J.L.; Ortega, G.S.; Overman, C.T.; Parent, S.; Piepke, A.; Pocar, A.; Pratte, J.-F.; Radeka, V.; Raguzin, E.; Rescia, S.; Richman, M.; Robinson, A.; Rossignol, T.; Rowson, P.C.; Roy, N.; Runge, J.; Saldanha, R.; Sangiorgio, S.; VIII, K. Skarpaas; St-Hilaire, G.; Stekhanov, V.; Stiegler, T.; Sun, X.L.; Tarka, M.; Todd, J.; Totev, T.I.; Tsang, R.; Tsang, T.; Vachon, F.; Veeraraghavan, V.; Viel, S.; Visser, G.; Vivo-Vilches, C.; Vuilleumier, J.-L.; Wagenpfeil, M.; Wager, T.; Walent, M.; Wang, Q.; Ward, M.; Watkins, J.; Weber, M.; Wei, W.; Wen, L.J.; Wichoski, U.; Wu, S.X.; Wu, W.H.; Wu, X.; Xia, Q.; Yang, H.; Yang, L.; Zeldovich, O.; Zhao, J.; Zhou, Y.; Ziegler, T. « less
- Date Published:
- Journal Name:
- Journal of Instrumentation
- Volume:
- 15
- Issue:
- 01
- ISSN:
- 1748-0221
- Page Range / eLocation ID:
- P01019 to P01019
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
More Like this
No document suggestions found
- Free Publicly Accessible Full Text
- Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1088/1748-0221/15/01/P01019
-
Have feedback or suggestions for a way to improve these results?
!- Citation Formats
- MLA
Cite: MLA FormatNakarmi, P., Ostrovskiy, I., Soma, A.K., Retière, F., Kharusi, S. Al, Alfaris, M., Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P.S., Beck, D., Belov, V., Bhatta, T., Blatchford, J., Breur, P.A., Brodsky, J.P., Brown, E., Brunner, T., Mamahit, S. Byrne, Caden, E., Cao, G.F., Cao, L., Chambers, C., Chana, B., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., Croix, A. De, Mesrobian-Kabakian, A. Der, DeVoe, R., Vacri, M.L. Di, Dilling, J., Ding, Y.Y., Dolinski, M.J., Doria, L., Dragone, A., Echevers, J., Edaltafar, F., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fontaine, R., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E.V., Heffner, M., Hoppe, E.W., Hößl, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M.J., Jiang, X.S., Karelin, A., Kaufman, L.J., Koffas, T., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Larson, A., Leach, K.G., Lenardo, B.G., Leonard, D.S., Li, G., Li, S., Li, Z., Licciardi, C., Lv, P., MacLellan, R., Massacret, N., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Moore, D.C., Murray, K., Natzke, C.R., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J.L., Ortega, G.S., Overman, C.T., Parent, S., Piepke, A., Pocar, A., Pratte, J.-F., Radeka, V., Raguzin, E., Rescia, S., Richman, M., Robinson, A., Rossignol, T., Rowson, P.C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., VIII, K. Skarpaas, St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X.L., Tarka, M., Todd, J., Totev, T.I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J.-L., Wagenpfeil, M., Wager, T., Walent, M., Wang, Q., Ward, M., Watkins, J., Weber, M., Wei, W., Wen, L.J., Wichoski, U., Wu, S.X., Wu, W.H., Wu, X., Xia, Q., Yang, H., Yang, L., Zeldovich, O., Zhao, J., Zhou, Y., and Ziegler, T. Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon. Retrieved from https://par.nsf.gov/biblio/10179915. Journal of Instrumentation 15.01 Web. doi:10.1088/1748-0221/15/01/P01019.
- APA
Cite: APA FormatNakarmi, P., Ostrovskiy, I., Soma, A.K., Retière, F., Kharusi, S. Al, Alfaris, M., Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P.S., Beck, D., Belov, V., Bhatta, T., Blatchford, J., Breur, P.A., Brodsky, J.P., Brown, E., Brunner, T., Mamahit, S. Byrne, Caden, E., Cao, G.F., Cao, L., Chambers, C., Chana, B., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., Croix, A. De, Mesrobian-Kabakian, A. Der, DeVoe, R., Vacri, M.L. Di, Dilling, J., Ding, Y.Y., Dolinski, M.J., Doria, L., Dragone, A., Echevers, J., Edaltafar, F., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fontaine, R., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E.V., Heffner, M., Hoppe, E.W., Hößl, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M.J., Jiang, X.S., Karelin, A., Kaufman, L.J., Koffas, T., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Larson, A., Leach, K.G., Lenardo, B.G., Leonard, D.S., Li, G., Li, S., Li, Z., Licciardi, C., Lv, P., MacLellan, R., Massacret, N., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Moore, D.C., Murray, K., Natzke, C.R., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J.L., Ortega, G.S., Overman, C.T., Parent, S., Piepke, A., Pocar, A., Pratte, J.-F., Radeka, V., Raguzin, E., Rescia, S., Richman, M., Robinson, A., Rossignol, T., Rowson, P.C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., VIII, K. Skarpaas, St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X.L., Tarka, M., Todd, J., Totev, T.I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J.-L., Wagenpfeil, M., Wager, T., Walent, M., Wang, Q., Ward, M., Watkins, J., Weber, M., Wei, W., Wen, L.J., Wichoski, U., Wu, S.X., Wu, W.H., Wu, X., Xia, Q., Yang, H., Yang, L., Zeldovich, O., Zhao, J., Zhou, Y., & Ziegler, T. Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon. Journal of Instrumentation, 15 (01). Retrieved from https://par.nsf.gov/biblio/10179915. https://doi.org/10.1088/1748-0221/15/01/P01019
- Chicago
Cite: Chicago FormatNakarmi, P., Ostrovskiy, I., Soma, A.K., Retière, F., Kharusi, S. Al, Alfaris, M., Anton, G., Arnquist, I.J., Badhrees, I., Barbeau, P.S., Beck, D., Belov, V., Bhatta, T., Blatchford, J., Breur, P.A., Brodsky, J.P., Brown, E., Brunner, T., Mamahit, S. Byrne, Caden, E., Cao, G.F., Cao, L., Chambers, C., Chana, B., Charlebois, S.A., Chiu, M., Cleveland, B., Coon, M., Craycraft, A., Dalmasson, J., Daniels, T., Darroch, L., Croix, A. De, Mesrobian-Kabakian, A. Der, DeVoe, R., Vacri, M.L. Di, Dilling, J., Ding, Y.Y., Dolinski, M.J., Doria, L., Dragone, A., Echevers, J., Edaltafar, F., Elbeltagi, M., Fabris, L., Fairbank, D., Fairbank, W., Farine, J., Ferrara, S., Feyzbakhsh, S., Fontaine, R., Fucarino, A., Gallina, G., Gautam, P., Giacomini, G., Goeldi, D., Gornea, R., Gratta, G., Hansen, E.V., Heffner, M., Hoppe, E.W., Hößl, J., House, A., Hughes, M., Iverson, A., Jamil, A., Jewell, M.J., Jiang, X.S., Karelin, A., Kaufman, L.J., Koffas, T., Krücken, R., Kuchenkov, A., Kumar, K.S., Lan, Y., Larson, A., Leach, K.G., Lenardo, B.G., Leonard, D.S., Li, G., Li, S., Li, Z., Licciardi, C., Lv, P., MacLellan, R., Massacret, N., McElroy, T., Medina-Peregrina, M., Michel, T., Mong, B., Moore, D.C., Murray, K., Natzke, C.R., Newby, R.J., Ning, Z., Njoya, O., Nolet, F., Nusair, O., Odgers, K., Odian, A., Oriunno, M., Orrell, J.L., Ortega, G.S., Overman, C.T., Parent, S., Piepke, A., Pocar, A., Pratte, J.-F., Radeka, V., Raguzin, E., Rescia, S., Richman, M., Robinson, A., Rossignol, T., Rowson, P.C., Roy, N., Runge, J., Saldanha, R., Sangiorgio, S., VIII, K. Skarpaas, St-Hilaire, G., Stekhanov, V., Stiegler, T., Sun, X.L., Tarka, M., Todd, J., Totev, T.I., Tsang, R., Tsang, T., Vachon, F., Veeraraghavan, V., Viel, S., Visser, G., Vivo-Vilches, C., Vuilleumier, J.-L., Wagenpfeil, M., Wager, T., Walent, M., Wang, Q., Ward, M., Watkins, J., Weber, M., Wei, W., Wen, L.J., Wichoski, U., Wu, S.X., Wu, W.H., Wu, X., Xia, Q., Yang, H., Yang, L., Zeldovich, O., Zhao, J., Zhou, Y., and Ziegler, T. "Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon". Journal of Instrumentation 15 (01). Country unknown/Code not available. https://doi.org/10.1088/1748-0221/15/01/P01019. https://par.nsf.gov/biblio/10179915.
- BibTeX
Cite: BibTeX Format@article{osti_10179915,
place = {Country unknown/Code not available}, title = {Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon}, url = {https://par.nsf.gov/biblio/10179915}, DOI = {10.1088/1748-0221/15/01/P01019}, abstractNote = {}, journal = {Journal of Instrumentation}, volume = {15}, number = {01}, author = {Nakarmi, P. and Ostrovskiy, I. and Soma, A.K. and Retière, F. and Kharusi, S. Al and Alfaris, M. and Anton, G. and Arnquist, I.J. and Badhrees, I. and Barbeau, P.S. and Beck, D. and Belov, V. and Bhatta, T. and Blatchford, J. and Breur, P.A. and Brodsky, J.P. and Brown, E. and Brunner, T. and Mamahit, S. Byrne and Caden, E. and Cao, G.F. and Cao, L. and Chambers, C. and Chana, B. and Charlebois, S.A. and Chiu, M. and Cleveland, B. and Coon, M. and Craycraft, A. and Dalmasson, J. and Daniels, T. and Darroch, L. and Croix, A. De and Mesrobian-Kabakian, A. Der and DeVoe, R. and Vacri, M.L. Di and Dilling, J. and Ding, Y.Y. and Dolinski, M.J. and Doria, L. and Dragone, A. and Echevers, J. and Edaltafar, F. and Elbeltagi, M. and Fabris, L. and Fairbank, D. and Fairbank, W. and Farine, J. and Ferrara, S. and Feyzbakhsh, S. and Fontaine, R. and Fucarino, A. and Gallina, G. and Gautam, P. and Giacomini, G. and Goeldi, D. and Gornea, R. and Gratta, G. and Hansen, E.V. and Heffner, M. and Hoppe, E.W. and Hößl, J. and House, A. and Hughes, M. and Iverson, A. and Jamil, A. and Jewell, M.J. and Jiang, X.S. and Karelin, A. and Kaufman, L.J. and Koffas, T. and Krücken, R. and Kuchenkov, A. and Kumar, K.S. and Lan, Y. and Larson, A. and Leach, K.G. and Lenardo, B.G. and Leonard, D.S. and Li, G. and Li, S. and Li, Z. and Licciardi, C. and Lv, P. and MacLellan, R. and Massacret, N. and McElroy, T. and Medina-Peregrina, M. and Michel, T. and Mong, B. and Moore, D.C. and Murray, K. and Natzke, C.R. and Newby, R.J. and Ning, Z. and Njoya, O. and Nolet, F. and Nusair, O. and Odgers, K. and Odian, A. and Oriunno, M. and Orrell, J.L. and Ortega, G.S. and Overman, C.T. and Parent, S. and Piepke, A. and Pocar, A. and Pratte, J.-F. and Radeka, V. and Raguzin, E. and Rescia, S. and Richman, M. and Robinson, A. and Rossignol, T. and Rowson, P.C. and Roy, N. and Runge, J. and Saldanha, R. and Sangiorgio, S. and VIII, K. Skarpaas and St-Hilaire, G. and Stekhanov, V. and Stiegler, T. and Sun, X.L. and Tarka, M. and Todd, J. and Totev, T.I. and Tsang, R. and Tsang, T. and Vachon, F. and Veeraraghavan, V. and Viel, S. and Visser, G. and Vivo-Vilches, C. and Vuilleumier, J.-L. and Wagenpfeil, M. and Wager, T. and Walent, M. and Wang, Q. and Ward, M. and Watkins, J. and Weber, M. and Wei, W. and Wen, L.J. and Wichoski, U. and Wu, S.X. and Wu, W.H. and Wu, X. and Xia, Q. and Yang, H. and Yang, L. and Zeldovich, O. and Zhao, J. and Zhou, Y. and Ziegler, T.}, }
- Save / Share this Record
- Send
to Email
Send to Email