Rezaee, Maysam, Tsai, Li-Chih, Haider, Muhammad Istiaque, Yazdi, Armin, Sanatizadeh, Ehsan, and Salowitz, Nathan P. Quantitative peel test for thin films/layers based on a coupled parametric and statistical study. Retrieved from https://par.nsf.gov/biblio/10180239. Scientific Reports 9.1 Web. doi:10.1038/s41598-019-55355-9.

Rezaee, Maysam, Tsai, Li-Chih, Haider, Muhammad Istiaque, Yazdi, Armin, Sanatizadeh, Ehsan, & Salowitz, Nathan P. Quantitative peel test for thin films/layers based on a coupled parametric and statistical study. Scientific Reports, 9 (1). Retrieved from https://par.nsf.gov/biblio/10180239. https://doi.org/10.1038/s41598-019-55355-9

Rezaee, Maysam, Tsai, Li-Chih, Haider, Muhammad Istiaque, Yazdi, Armin, Sanatizadeh, Ehsan, and Salowitz, Nathan P. "Quantitative peel test for thin films/layers based on a coupled parametric and statistical study". Scientific Reports 9 (1). Country unknown/Code not available. https://doi.org/10.1038/s41598-019-55355-9. https://par.nsf.gov/biblio/10180239.

@article{osti_10180239,
place = {Country unknown/Code not available}, title = {Quantitative peel test for thin films/layers based on a coupled parametric and statistical study}, url = {https://par.nsf.gov/biblio/10180239}, DOI = {10.1038/s41598-019-55355-9}, abstractNote = {}, journal = {Scientific Reports}, volume = {9}, number = {1}, author = {Rezaee, Maysam and Tsai, Li-Chih and Haider, Muhammad Istiaque and Yazdi, Armin and Sanatizadeh, Ehsan and Salowitz, Nathan P.}, }