Sun, Zeyu, Sadiqbatcha, Sheriff, Zhao, Hengyang, and Tan, Sheldon X.-D. Saturation-Volume Estimation for Multisegment Copper Interconnect Wires. Retrieved from https://par.nsf.gov/biblio/10195465. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27.7 Web. doi:10.1109/TVLSI.2019.2901824.

Sun, Zeyu, Sadiqbatcha, Sheriff, Zhao, Hengyang, & Tan, Sheldon X.-D. Saturation-Volume Estimation for Multisegment Copper Interconnect Wires. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 27 (7). Retrieved from https://par.nsf.gov/biblio/10195465. https://doi.org/10.1109/TVLSI.2019.2901824

Sun, Zeyu, Sadiqbatcha, Sheriff, Zhao, Hengyang, and Tan, Sheldon X.-D. "Saturation-Volume Estimation for Multisegment Copper Interconnect Wires". IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (7). Country unknown/Code not available. https://doi.org/10.1109/TVLSI.2019.2901824. https://par.nsf.gov/biblio/10195465.

@article{osti_10195465,
place = {Country unknown/Code not available}, title = {Saturation-Volume Estimation for Multisegment Copper Interconnect Wires}, url = {https://par.nsf.gov/biblio/10195465}, DOI = {10.1109/TVLSI.2019.2901824}, abstractNote = {}, journal = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems}, volume = {27}, number = {7}, author = {Sun, Zeyu and Sadiqbatcha, Sheriff and Zhao, Hengyang and Tan, Sheldon X.-D.}, }