Sadiqbatcha, Sheriff, Sun, Zeyu, and Tan, Sheldon X.-D. Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs. Retrieved from https://par.nsf.gov/biblio/10195466. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 39.4 Web. doi:10.1109/TCAD.2019.2907908.

Sadiqbatcha, Sheriff, Sun, Zeyu, & Tan, Sheldon X.-D. Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 39 (4). Retrieved from https://par.nsf.gov/biblio/10195466. https://doi.org/10.1109/TCAD.2019.2907908

Sadiqbatcha, Sheriff, Sun, Zeyu, and Tan, Sheldon X.-D. "Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 39 (4). Country unknown/Code not available. https://doi.org/10.1109/TCAD.2019.2907908. https://par.nsf.gov/biblio/10195466.

@article{osti_10195466,
place = {Country unknown/Code not available}, title = {Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs}, url = {https://par.nsf.gov/biblio/10195466}, DOI = {10.1109/TCAD.2019.2907908}, abstractNote = {}, journal = {IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems}, volume = {39}, number = {4}, author = {Sadiqbatcha, Sheriff and Sun, Zeyu and Tan, Sheldon X.-D.}, }