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Title: Layer-Dependent Bit Error Variation in 3-D NAND Flash Under Ionizing Radiation
Award ID(s):
1929099
PAR ID:
10196213
Author(s) / Creator(s):
; ; ; ;
Date Published:
Journal Name:
IEEE Transactions on Nuclear Science
Volume:
67
Issue:
9
ISSN:
0018-9499
Page Range / eLocation ID:
2021 to 2027
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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