Tan, Yingshui, Jin, Baihong, Nettekoven, Alexander, Chen, Yuxin, Yue, Yisong, Topcu, Ufuk, and Sangiovanni-Vincentelli, Alberto. An Encoder-Decoder Based Approach for Anomaly Detection with Application in Additive Manufacturing. Retrieved from https://par.nsf.gov/biblio/10197672. 18th IEEE International Conference On Machine Learning And Applications (ICMLA) . Web. doi:10.1109/ICMLA.2019.00171.

Tan, Yingshui, Jin, Baihong, Nettekoven, Alexander, Chen, Yuxin, Yue, Yisong, Topcu, Ufuk, & Sangiovanni-Vincentelli, Alberto. An Encoder-Decoder Based Approach for Anomaly Detection with Application in Additive Manufacturing. 18th IEEE International Conference On Machine Learning And Applications (ICMLA), (). Retrieved from https://par.nsf.gov/biblio/10197672. https://doi.org/10.1109/ICMLA.2019.00171

Tan, Yingshui, Jin, Baihong, Nettekoven, Alexander, Chen, Yuxin, Yue, Yisong, Topcu, Ufuk, and Sangiovanni-Vincentelli, Alberto. "An Encoder-Decoder Based Approach for Anomaly Detection with Application in Additive Manufacturing". 18th IEEE International Conference On Machine Learning And Applications (ICMLA) (). Country unknown/Code not available. https://doi.org/10.1109/ICMLA.2019.00171. https://par.nsf.gov/biblio/10197672.

@article{osti_10197672,
place = {Country unknown/Code not available}, title = {An Encoder-Decoder Based Approach for Anomaly Detection with Application in Additive Manufacturing}, url = {https://par.nsf.gov/biblio/10197672}, DOI = {10.1109/ICMLA.2019.00171}, abstractNote = {}, journal = {18th IEEE International Conference On Machine Learning And Applications (ICMLA)}, author = {Tan, Yingshui and Jin, Baihong and Nettekoven, Alexander and Chen, Yuxin and Yue, Yisong and Topcu, Ufuk and Sangiovanni-Vincentelli, Alberto}, }