Khan, Raihan Sayeed, Silva, Helena, Noor, Nafisa, Jin, Chenglu, Muneer, Sadid, Dirisaglik, Faruk, Cywar, Adam, Nguyen, Phuong Ha, van Dijk, Marten, and Gokirmak, Ali. Exploiting Lithography Limits for Hardware Security Applications. Retrieved from https://par.nsf.gov/biblio/10198072. 2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO) . Web. doi:10.1109/NANO46743.2019.8993902.

Khan, Raihan Sayeed, Silva, Helena, Noor, Nafisa, Jin, Chenglu, Muneer, Sadid, Dirisaglik, Faruk, Cywar, Adam, Nguyen, Phuong Ha, van Dijk, Marten, & Gokirmak, Ali. Exploiting Lithography Limits for Hardware Security Applications. 2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO), (). Retrieved from https://par.nsf.gov/biblio/10198072. https://doi.org/10.1109/NANO46743.2019.8993902

Khan, Raihan Sayeed, Silva, Helena, Noor, Nafisa, Jin, Chenglu, Muneer, Sadid, Dirisaglik, Faruk, Cywar, Adam, Nguyen, Phuong Ha, van Dijk, Marten, and Gokirmak, Ali. "Exploiting Lithography Limits for Hardware Security Applications". 2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO) (). Country unknown/Code not available. https://doi.org/10.1109/NANO46743.2019.8993902. https://par.nsf.gov/biblio/10198072.

@article{osti_10198072,
place = {Country unknown/Code not available}, title = {Exploiting Lithography Limits for Hardware Security Applications}, url = {https://par.nsf.gov/biblio/10198072}, DOI = {10.1109/NANO46743.2019.8993902}, abstractNote = {}, journal = {2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO)}, author = {Khan, Raihan Sayeed and Silva, Helena and Noor, Nafisa and Jin, Chenglu and Muneer, Sadid and Dirisaglik, Faruk and Cywar, Adam and Nguyen, Phuong Ha and van Dijk, Marten and Gokirmak, Ali}, }