Li, Chao, Wei, Bochao, Chai, Xiao, Yang, Jeremy, Daruwalla, Anosh, Ayazi, Farrokh, and Raman, C. Robust characterization of microfabricated atomic beams on a six-month time scale. Retrieved from https://par.nsf.gov/biblio/10198235. Physical Review Research 2.2 Web. doi:10.1103/PhysRevResearch.2.023239.

Li, Chao, Wei, Bochao, Chai, Xiao, Yang, Jeremy, Daruwalla, Anosh, Ayazi, Farrokh, & Raman, C. Robust characterization of microfabricated atomic beams on a six-month time scale. Physical Review Research, 2 (2). Retrieved from https://par.nsf.gov/biblio/10198235. https://doi.org/10.1103/PhysRevResearch.2.023239

Li, Chao, Wei, Bochao, Chai, Xiao, Yang, Jeremy, Daruwalla, Anosh, Ayazi, Farrokh, and Raman, C. "Robust characterization of microfabricated atomic beams on a six-month time scale". Physical Review Research 2 (2). Country unknown/Code not available. https://doi.org/10.1103/PhysRevResearch.2.023239. https://par.nsf.gov/biblio/10198235.

@article{osti_10198235,
place = {Country unknown/Code not available}, title = {Robust characterization of microfabricated atomic beams on a six-month time scale}, url = {https://par.nsf.gov/biblio/10198235}, DOI = {10.1103/PhysRevResearch.2.023239}, abstractNote = {}, journal = {Physical Review Research}, volume = {2}, number = {2}, author = {Li, Chao and Wei, Bochao and Chai, Xiao and Yang, Jeremy and Daruwalla, Anosh and Ayazi, Farrokh and Raman, C.}, }