Wang, Fulin, Echlin, McLean P., Taylor, Aidan A., Shin, Jungho, Bammes, Benjamin, Levin, Barnaby D.A., De Graef, Marc, Pollock, Tresa M., and Gianola, Daniel S. Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition. Retrieved from https://par.nsf.gov/biblio/10203708. Ultramicroscopy 220.C Web. doi:10.1016/j.ultramic.2020.113160.

Wang, Fulin, Echlin, McLean P., Taylor, Aidan A., Shin, Jungho, Bammes, Benjamin, Levin, Barnaby D.A., De Graef, Marc, Pollock, Tresa M., & Gianola, Daniel S. Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition. Ultramicroscopy, 220 (C). Retrieved from https://par.nsf.gov/biblio/10203708. https://doi.org/10.1016/j.ultramic.2020.113160

Wang, Fulin, Echlin, McLean P., Taylor, Aidan A., Shin, Jungho, Bammes, Benjamin, Levin, Barnaby D.A., De Graef, Marc, Pollock, Tresa M., and Gianola, Daniel S. "Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition". Ultramicroscopy 220 (C). Country unknown/Code not available. https://doi.org/10.1016/j.ultramic.2020.113160. https://par.nsf.gov/biblio/10203708.

@article{osti_10203708,
place = {Country unknown/Code not available}, title = {Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition}, url = {https://par.nsf.gov/biblio/10203708}, DOI = {10.1016/j.ultramic.2020.113160}, abstractNote = {}, journal = {Ultramicroscopy}, volume = {220}, number = {C}, author = {Wang, Fulin and Echlin, McLean P. and Taylor, Aidan A. and Shin, Jungho and Bammes, Benjamin and Levin, Barnaby D.A. and De Graef, Marc and Pollock, Tresa M. and Gianola, Daniel S.}, editor = {null} }