Wang, Fulin, Echlin, McLean P., Taylor, Aidan A., Shin, Jungho, Bammes, Benjamin, Levin, Barnaby D.A., De Graef, Marc, Pollock, Tresa M., and Gianola, Daniel S. Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition. Retrieved from https://par.nsf.gov/biblio/10203708. Ultramicroscopy 220.C Web. doi:10.1016/j.ultramic.2020.113160.
Wang, Fulin, Echlin, McLean P., Taylor, Aidan A., Shin, Jungho, Bammes, Benjamin, Levin, Barnaby D.A., De Graef, Marc, Pollock, Tresa M., & Gianola, Daniel S. Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition. Ultramicroscopy, 220 (C). Retrieved from https://par.nsf.gov/biblio/10203708. https://doi.org/10.1016/j.ultramic.2020.113160
Wang, Fulin, Echlin, McLean P., Taylor, Aidan A., Shin, Jungho, Bammes, Benjamin, Levin, Barnaby D.A., De Graef, Marc, Pollock, Tresa M., and Gianola, Daniel S.
"Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition". Ultramicroscopy 220 (C). Country unknown/Code not available. https://doi.org/10.1016/j.ultramic.2020.113160.https://par.nsf.gov/biblio/10203708.
@article{osti_10203708,
place = {Country unknown/Code not available},
title = {Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition},
url = {https://par.nsf.gov/biblio/10203708},
DOI = {10.1016/j.ultramic.2020.113160},
abstractNote = {},
journal = {Ultramicroscopy},
volume = {220},
number = {C},
author = {Wang, Fulin and Echlin, McLean P. and Taylor, Aidan A. and Shin, Jungho and Bammes, Benjamin and Levin, Barnaby D.A. and De Graef, Marc and Pollock, Tresa M. and Gianola, Daniel S.},
editor = {null}
}
Warning: Leaving National Science Foundation Website
You are now leaving the National Science Foundation website to go to a non-government website.
Website:
NSF takes no responsibility for and exercises no control over the views expressed or the accuracy of
the information contained on this site. Also be aware that NSF's privacy policy does not apply to this site.