Coleman, Kathleen, Bermejo, Raul, Leguillon, Dominique, and Trolier-McKinstry, Susan. Thickness Dependence of crack initiation and propagation in stacks for piezoelectric microelectromechanical systems. Retrieved from https://par.nsf.gov/biblio/10204940. Acta Materialia 191.C Web. doi:10.1016/j.actamat.2020.03.030.

Coleman, Kathleen, Bermejo, Raul, Leguillon, Dominique, & Trolier-McKinstry, Susan. Thickness Dependence of crack initiation and propagation in stacks for piezoelectric microelectromechanical systems. Acta Materialia, 191 (C). Retrieved from https://par.nsf.gov/biblio/10204940. https://doi.org/10.1016/j.actamat.2020.03.030

Coleman, Kathleen, Bermejo, Raul, Leguillon, Dominique, and Trolier-McKinstry, Susan. "Thickness Dependence of crack initiation and propagation in stacks for piezoelectric microelectromechanical systems". Acta Materialia 191 (C). Country unknown/Code not available. https://doi.org/10.1016/j.actamat.2020.03.030. https://par.nsf.gov/biblio/10204940.

@article{osti_10204940,
place = {Country unknown/Code not available}, title = {Thickness Dependence of crack initiation and propagation in stacks for piezoelectric microelectromechanical systems}, url = {https://par.nsf.gov/biblio/10204940}, DOI = {10.1016/j.actamat.2020.03.030}, abstractNote = {}, journal = {Acta Materialia}, volume = {191}, number = {C}, author = {Coleman, Kathleen and Bermejo, Raul and Leguillon, Dominique and Trolier-McKinstry, Susan}, editor = {null} }