Banihashemi, Fateme, Bu, Guanhong, Thaker, Amar, Williams, Dewight, Lin, Jerry Y.S., and Nannenga, Brent L. Beam-sensitive metal-organic framework structure determination by microcrystal electron diffraction. Retrieved from https://par.nsf.gov/biblio/10208050. Ultramicroscopy 216.C Web. doi:10.1016/j.ultramic.2020.113048.

Banihashemi, Fateme, Bu, Guanhong, Thaker, Amar, Williams, Dewight, Lin, Jerry Y.S., & Nannenga, Brent L. Beam-sensitive metal-organic framework structure determination by microcrystal electron diffraction. Ultramicroscopy, 216 (C). Retrieved from https://par.nsf.gov/biblio/10208050. https://doi.org/10.1016/j.ultramic.2020.113048

Banihashemi, Fateme, Bu, Guanhong, Thaker, Amar, Williams, Dewight, Lin, Jerry Y.S., and Nannenga, Brent L. "Beam-sensitive metal-organic framework structure determination by microcrystal electron diffraction". Ultramicroscopy 216 (C). Country unknown/Code not available. https://doi.org/10.1016/j.ultramic.2020.113048. https://par.nsf.gov/biblio/10208050.

@article{osti_10208050,
place = {Country unknown/Code not available}, title = {Beam-sensitive metal-organic framework structure determination by microcrystal electron diffraction}, url = {https://par.nsf.gov/biblio/10208050}, DOI = {10.1016/j.ultramic.2020.113048}, abstractNote = {}, journal = {Ultramicroscopy}, volume = {216}, number = {C}, author = {Banihashemi, Fateme and Bu, Guanhong and Thaker, Amar and Williams, Dewight and Lin, Jerry Y.S. and Nannenga, Brent L.}, editor = {null} }