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Title: Sketch-Based Tensor Decomposition for Non-Parametric Monitoring of Electrospinning Processes

Electrospinning is a promising process to fabricate functional parts from macrofibers and nanofibers of bio-compatible materials including collagen, polylactide (PLA), and polyacrylonitrile (PAN). However, the functionality of the produced parts highly rely on quality, repeatability, and uniformity of the electrospun fibers. Due to the variations in material composition, process settings, and ambient conditions, the process suffers from large variations. In particular, the fiber formation in the stable regime (i.e., Taylor cone and jet) and its propagation to the substrate plays the most significant role in the process stability. This work aims to designing a fast process monitoring tool from scratch for monitoring the dynamic electrospinning process based on the Taylor cone and jet videos. Nevertheless, this is challenging since the videos are of high frequency and high dimension, and the monitoring statistics may not have a parametric distribution. To achieve this goal, a framework integrating image analysis, sketch-based tensor decomposition, and non-parametric monitoring, is proposed. In particular, we use Tucker tensor-sketch (Tucker-TS) based tensor decomposition to extract the sparse structure representations of the videos. Additionally, the extracted monitoring variables are non-normally distributed, hence non-parametric bootstrap Hotelling T2 control chart is deployed to handle this issue during the monitoring. The framework is demonstrated by electrospinning a PAN-based polymeric solution. Finally, it is demonstrated that the proposed framework, which uses Tucker-TS, largely outperformed the computational speed of the alternating least squares (ALS) approach for the Tucker tensor decomposition, i.e., Tucker-ALS, in various anomaly detection tasks while keeping the comparable anomaly detection accuracy.

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ASME 2020 15th International Manufacturing Science and Engineering Conference
Medium: X
Sponsoring Org:
National Science Foundation
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