Commercial USB IC Soft-Failure Sensitivity Measurement Method and Trend Analysis
- Award ID(s):
- 1916535
- NSF-PAR ID:
- 10213112
- Date Published:
- Journal Name:
- 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
- Page Range / eLocation ID:
- 200 to 204
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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