Measurement-Based Validation of Integrated Circuit Transient Electromagnetic Event Sensors
- Award ID(s):
- 1916535
- NSF-PAR ID:
- 10213261
- Date Published:
- Journal Name:
- IEEE Transactions on Electromagnetic Compatibility
- Volume:
- 62
- Issue:
- 4
- ISSN:
- 0018-9375
- Page Range / eLocation ID:
- 1555 to 1562
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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