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Title: Measurement-Based Validation of Integrated Circuit Transient Electromagnetic Event Sensors
Award ID(s):
1916535
NSF-PAR ID:
10213261
Author(s) / Creator(s):
; ; ; ; ; ;
Date Published:
Journal Name:
IEEE Transactions on Electromagnetic Compatibility
Volume:
62
Issue:
4
ISSN:
0018-9375
Page Range / eLocation ID:
1555 to 1562
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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