Thelen, Jacob L., Bishop, Camille, Bagchi, Kushal, Sunday, Daniel F., Gann, Eliot, Mukherjee, Subhrangsu, Richter, Lee J., Kline, R. Joseph, Ediger, M. D., and DeLongchamp, Dean M. Molecular Orientation Depth Profiles in Organic Glasses Using Polarized Resonant Soft X-ray Reflectivity. Retrieved from https://par.nsf.gov/biblio/10213833. Chemistry of Materials 32.15 Web. doi:10.1021/acs.chemmater.0c02044.

Thelen, Jacob L., Bishop, Camille, Bagchi, Kushal, Sunday, Daniel F., Gann, Eliot, Mukherjee, Subhrangsu, Richter, Lee J., Kline, R. Joseph, Ediger, M. D., & DeLongchamp, Dean M. Molecular Orientation Depth Profiles in Organic Glasses Using Polarized Resonant Soft X-ray Reflectivity. Chemistry of Materials, 32 (15). Retrieved from https://par.nsf.gov/biblio/10213833. https://doi.org/10.1021/acs.chemmater.0c02044

Thelen, Jacob L., Bishop, Camille, Bagchi, Kushal, Sunday, Daniel F., Gann, Eliot, Mukherjee, Subhrangsu, Richter, Lee J., Kline, R. Joseph, Ediger, M. D., and DeLongchamp, Dean M. "Molecular Orientation Depth Profiles in Organic Glasses Using Polarized Resonant Soft X-ray Reflectivity". Chemistry of Materials 32 (15). Country unknown/Code not available. https://doi.org/10.1021/acs.chemmater.0c02044. https://par.nsf.gov/biblio/10213833.

@article{osti_10213833,
place = {Country unknown/Code not available}, title = {Molecular Orientation Depth Profiles in Organic Glasses Using Polarized Resonant Soft X-ray Reflectivity}, url = {https://par.nsf.gov/biblio/10213833}, DOI = {10.1021/acs.chemmater.0c02044}, abstractNote = {}, journal = {Chemistry of Materials}, volume = {32}, number = {15}, author = {Thelen, Jacob L. and Bishop, Camille and Bagchi, Kushal and Sunday, Daniel F. and Gann, Eliot and Mukherjee, Subhrangsu and Richter, Lee J. and Kline, R. Joseph and Ediger, M. D. and DeLongchamp, Dean M.}, editor = {null} }