Asymmetric sizing: An effective design approach for SRAM cells against BTI aging
- Award ID(s):
- 1719047
- NSF-PAR ID:
- 10216364
- Date Published:
- Journal Name:
- 2017 IEEE 35th VLSI Test Symposium (VTS)
- Page Range / eLocation ID:
- 1-6
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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