Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices
- Award ID(s):
- 1755733
- NSF-PAR ID:
- 10220223
- Date Published:
- Journal Name:
- Journal of Electronic Testing
- Volume:
- 36
- Issue:
- 3
- ISSN:
- 0923-8174
- Page Range / eLocation ID:
- 301 to 311
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
More Like this
No document suggestions found