Ghosh, Pallabi, Botero, Ulbert J, Ganji, Fatemeh, Woodard, Damon, Chakraborty, Rajat Subhra, and Forte, Domenic. Automated Detection and Localization of Counterfeit Chip Defects by Texture Analysis in Infrared (IR) Domain. Retrieved from https://par.nsf.gov/biblio/10221334. IEEE Physical Assurance and Inspection of Electronics (PAINE) . Web. doi:10.1109/PAINE49178.2020.9337739.

Ghosh, Pallabi, Botero, Ulbert J, Ganji, Fatemeh, Woodard, Damon, Chakraborty, Rajat Subhra, & Forte, Domenic. Automated Detection and Localization of Counterfeit Chip Defects by Texture Analysis in Infrared (IR) Domain. IEEE Physical Assurance and Inspection of Electronics (PAINE), (). Retrieved from https://par.nsf.gov/biblio/10221334. https://doi.org/10.1109/PAINE49178.2020.9337739

Ghosh, Pallabi, Botero, Ulbert J, Ganji, Fatemeh, Woodard, Damon, Chakraborty, Rajat Subhra, and Forte, Domenic. "Automated Detection and Localization of Counterfeit Chip Defects by Texture Analysis in Infrared (IR) Domain". IEEE Physical Assurance and Inspection of Electronics (PAINE) (). Country unknown/Code not available. https://doi.org/10.1109/PAINE49178.2020.9337739. https://par.nsf.gov/biblio/10221334.

@article{osti_10221334,
place = {Country unknown/Code not available}, title = {Automated Detection and Localization of Counterfeit Chip Defects by Texture Analysis in Infrared (IR) Domain}, url = {https://par.nsf.gov/biblio/10221334}, DOI = {10.1109/PAINE49178.2020.9337739}, abstractNote = {}, journal = {IEEE Physical Assurance and Inspection of Electronics (PAINE)}, author = {Ghosh, Pallabi and Botero, Ulbert J and Ganji, Fatemeh and Woodard, Damon and Chakraborty, Rajat Subhra and Forte, Domenic}, editor = {null} }