Cho, Chullhee, Kang, Pilgyu, Taqieddin, Amir, Jing, Yuhang, Yong, Keong, Kim, Jin Myung, Haque, Md Farhadul, Aluru, Narayana R., and Nam, SungWoo. Strain-resilient electrical functionality in thin-film metal electrodes using two-dimensional interlayers. Retrieved from https://par.nsf.gov/biblio/10224800. Nature Electronics 4.2 Web. doi:10.1038/s41928-021-00538-4.

Cho, Chullhee, Kang, Pilgyu, Taqieddin, Amir, Jing, Yuhang, Yong, Keong, Kim, Jin Myung, Haque, Md Farhadul, Aluru, Narayana R., & Nam, SungWoo. Strain-resilient electrical functionality in thin-film metal electrodes using two-dimensional interlayers. Nature Electronics, 4 (2). Retrieved from https://par.nsf.gov/biblio/10224800. https://doi.org/10.1038/s41928-021-00538-4

Cho, Chullhee, Kang, Pilgyu, Taqieddin, Amir, Jing, Yuhang, Yong, Keong, Kim, Jin Myung, Haque, Md Farhadul, Aluru, Narayana R., and Nam, SungWoo. "Strain-resilient electrical functionality in thin-film metal electrodes using two-dimensional interlayers". Nature Electronics 4 (2). Country unknown/Code not available. https://doi.org/10.1038/s41928-021-00538-4. https://par.nsf.gov/biblio/10224800.

@article{osti_10224800,
place = {Country unknown/Code not available}, title = {Strain-resilient electrical functionality in thin-film metal electrodes using two-dimensional interlayers}, url = {https://par.nsf.gov/biblio/10224800}, DOI = {10.1038/s41928-021-00538-4}, abstractNote = {}, journal = {Nature Electronics}, volume = {4}, number = {2}, author = {Cho, Chullhee and Kang, Pilgyu and Taqieddin, Amir and Jing, Yuhang and Yong, Keong and Kim, Jin Myung and Haque, Md Farhadul and Aluru, Narayana R. and Nam, SungWoo}, editor = {null} }