Probing Device-relevant Defects in van der Waals Layered Materials

Hickey, Danielle Reifsnyder

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Citation Details

Probing Device-relevant Defects in van der Waals Layered Materials

Award ID(s):: 1654107

NSF-PAR ID:: 10231411

Author(s) / Creator(s):: Hickey, Danielle Reifsnyder

Date Published:: 2020-07-30

Journal Name:: Microscopy and microanalysis

Volume:: 26

Issue:: Suppl 2

ISSN:: 1435-8115

Page Range / eLocation ID:: 1618 - 1619

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
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