Probing Device-relevant Defects in van der Waals Layered Materials
- Award ID(s):
- 1654107
- NSF-PAR ID:
- 10231411
- Date Published:
- Journal Name:
- Microscopy and microanalysis
- Volume:
- 26
- Issue:
- Suppl 2
- ISSN:
- 1435-8115
- Page Range / eLocation ID:
- 1618 - 1619
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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