Partial TMR for Improving the Soft Error Reliability of SRAM-Based FPGA Designs
- Award ID(s):
- 1738550
- PAR ID:
- 10231638
- Date Published:
- Journal Name:
- IEEE Transactions on Nuclear Science
- Volume:
- 68
- Issue:
- 5
- ISSN:
- 0018-9499
- Page Range / eLocation ID:
- 1023 to 1031
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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