Nonparametric Iterated-Logarithm Extensions of the Sequential Generalized Likelihood Ratio Test (Journal Article) | NSF PAGES

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Citation Details

Nonparametric Iterated-Logarithm Extensions of the Sequential Generalized Likelihood Ratio Test

Authors:: Shin, Jaehyeok; Ramdas, Aaditya; Rinaldo, Alessandro

Award ID(s):: 1916320 2015489

Publication Date:: 2021-06-01

NSF-PAR ID:: 10251928

Journal Name:: IEEE Journal on Selected Areas in Information Theory

Volume:: 2

Issue:: 2

Page Range or eLocation-ID:: 691 to 704

ISSN:: 2641-8770

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Publisher's Version of Record
https://doi.org/10.1109/JSAIT.2021.3081105