Guo, Haoqiang, Peng, Lu, Zhang, Jian, Chen, Qing, and LeCompte, Travis D. ATT: A Fault-Tolerant ReRAM Accelerator for Attention-based Neural Networks. Retrieved from https://par.nsf.gov/biblio/10252624. Proceedings of the 38th IEEE International Conference on Computer Design (ICCD) . Web. doi:10.1109/ICCD50377.2020.00047.

Guo, Haoqiang, Peng, Lu, Zhang, Jian, Chen, Qing, & LeCompte, Travis D. ATT: A Fault-Tolerant ReRAM Accelerator for Attention-based Neural Networks. Proceedings of the 38th IEEE International Conference on Computer Design (ICCD), (). Retrieved from https://par.nsf.gov/biblio/10252624. https://doi.org/10.1109/ICCD50377.2020.00047

Guo, Haoqiang, Peng, Lu, Zhang, Jian, Chen, Qing, and LeCompte, Travis D. "ATT: A Fault-Tolerant ReRAM Accelerator for Attention-based Neural Networks". Proceedings of the 38th IEEE International Conference on Computer Design (ICCD) (). Country unknown/Code not available. https://doi.org/10.1109/ICCD50377.2020.00047. https://par.nsf.gov/biblio/10252624.

@article{osti_10252624,
place = {Country unknown/Code not available}, title = {ATT: A Fault-Tolerant ReRAM Accelerator for Attention-based Neural Networks}, url = {https://par.nsf.gov/biblio/10252624}, DOI = {10.1109/ICCD50377.2020.00047}, abstractNote = {}, journal = {Proceedings of the 38th IEEE International Conference on Computer Design (ICCD)}, author = {Guo, Haoqiang and Peng, Lu and Zhang, Jian and Chen, Qing and LeCompte, Travis D}, editor = {null} }