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Title: Understanding Reproducibility and Characteristics of Flaky Tests Through Test Reruns in Java Projects
Award ID(s):
1763788 1839010
NSF-PAR ID:
10273112
Author(s) / Creator(s):
; ; ; ;
Date Published:
Journal Name:
2020 IEEE 31st International Symposium on Software Reliability Engineering (ISSRE)
Page Range / eLocation ID:
403 to 413
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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