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1. Error Resilient Neuromorphic Systems Using Embedded Predictive Neuron Checks

   Amarnath, Chandramouli. ; Chatterjee, Abhijit. ( March 2023 , Latin American Test Symposium)

   The reliability of emerging neuromorphic compute fabrics is of great concern due to their widespread use in critical data-intensive applications. Ensuring such reliability is difficult due to the intensity of underlying computations (billions of parameters), errors induced by low power operation and the complex relationship between errors in computations and their effect on network performance accuracy. We study the problem of designing error-resilient neuromorphic systems where errors can stem from: (a) soft errors in computation of matrix-vector multiplications and neuron activations, (b) malicious trojan and adversarial security attacks and (c) effects of manufacturing process variations on analog crossbar arrays that can affect DNN accuracy. The core principle of error detection relies on embedded predictive neuron checks using invariants derived from the statistics of nominal neuron activation patterns of hidden layers of a neural network. Algorithmic encodings of hidden neuron function are also used to derive invariants for checking. A key contribution is designing checks that are robust to the inherent nonlinearity of neuron computations with minimal impact on error detection coverage. Once errors are detected, they are corrected using probabilistic methods due to the difficulties involved in exact error diagnosis in such complex systems. The technique is scalable across soft errors as well as a range of security attacks. The effects of manufacturing process variations are handled through the use of compact tests from which DNN performance can be assessed using learning techniques. Experimental results on a variety of neuromorphic test systems: DNNs, spiking networks and hyperdimensional computing are presented. 

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2. Error Resilient Hyperdimensional Computing Using Hypervector Encoding and Cross-Clustering

   https://doi.org/10.1109/VTS60656.2024.10538955  

   Mejri, Mohamed ; Amarnath, Chandramouli ; Chatterjee, Abhijit ( April 2024 , IEEE)

   Emerging brain-inspired hyperdimensional computing (HDC) algorithms are vulnerable to timing and soft errors in associative memory used to store high-dimensional data representations. Such errors can significantly degrade HDC performance. A key challenge is error correction after an error in computation is detected. This work presents two novel error resilience frameworks for hyperdimensional computing systems. The first, called the checksum hypervector encoding (CHE) framework, relies on creation of a single additional hypervector that is a checksum of all the class hypervectors of the HDC system. For error resilience, elementwise validation of the checksum property is performed and those elements across all class vectors for which the property fails are removed from consideration. For an HDC system with K class hypervectors of dimension D, the second cross-hypervector clustering (CHC) framework clusters D, Kdimensional vectors consisting of the i-th element of each of the K HDC class hypervectors, 1 ≤ i ≤ K. Statistical properties of these vector clusters are checked prior to each hypervector query and all the elements of all K-dimensional vectors corresponding to statistical outlier vectors are removed as before. The choice of which framework to use is dictated by the complexity of the dataset to classify. Up to three orders of magnitude better resilience to errors than the state-of-the-art across multiple HDC high-dimensional encoding (representation) systems is demonstrated. 

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3. In-situ particle analysis with heterogeneous background: a machine learning approach

   https://doi.org/10.1038/s41598-024-59558-7  

   Alam, Adeeb Ibne ; Rahman, Md Hafizur ; Zia, Akhter ; Lowry, Nate ; Chakraborty, Prabuddha ; Hassan, Md Rafiul ; Khoda, Bashir ( May 2024 , Scientific Reports)

   We propose a novel framework that combines state-of-the-art deep learning approaches with pre- and post-processing algorithms for particle detection in complex/heterogeneous backgrounds common in the manufacturing domain. Traditional methods, like size analyzers and those based on dilution, image processing, or deep learning, typically excel with homogeneous backgrounds. Yet, they often fall short in accurately detecting particles against the intricate and varied backgrounds characteristic of heterogeneous particle–substrate (HPS) interfaces in manufacturing. To address this, we've developed a flexible framework designed to detect particles in diverse environments and input types. Our modular framework hinges on model selection and AI-guided particle detection as its core, with preprocessing and postprocessing as integral components, creating a four-step process. This system is versatile, allowing for various preprocessing, AI model selections, and post-processing strategies. We demonstrate this with an entrainment-based particle delivery method, transferring various particles onto substrates that mimic the HPS interface. By altering particle and substrate properties (e.g., material type, size, roughness, shape) and process parameters (e.g., capillary number) during particle entrainment, we capture images under different ambient lighting conditions, introducing a range of HPS background complexities. In the preprocessing phase, we apply image enhancement and sharpening techniques to improve detection accuracy. Specifically, image enhancement adjusts the dynamic range and histogram, while sharpening increases contrast by combining the high pass filter output with the base image. We introduce an image classifier model (based on the type of heterogeneity), employing Transfer Learning with MobileNet as a Model Selector, to identify the most appropriate AI model (i.e., YOLO model) for analyzing each specific image, thereby enhancing detection accuracy across particle–substrate variations. Following image classification based on heterogeneity, the relevant YOLO model is employed for particle identification, with a distinct YOLO model generated for each heterogeneity type, improving overall classification performance. In the post-processing phase, domain knowledge is used to minimize false positives. Our analysis indicates that the AI-guided framework maintains consistent precision and recall across various HPS conditions, with the harmonic mean of these metrics comparable to those of individual AI model outcomes. This tool shows potential for advancing in-situ process monitoring across multiple manufacturing operations, including high-density powder-based 3D printing, powder metallurgy, extreme environment coatings, particle categorization, and semiconductor manufacturing.

    

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4. Overcoming leakage in quantum error correction

   https://doi.org/10.1038/s41567-023-02226-w  

   Miao, Kevin C. ; McEwen, Matt ; Atalaya, Juan ; Kafri, Dvir ; Pryadko, Leonid P. ; Bengtsson, Andreas ; Opremcak, Alex ; Satzinger, Kevin J. ; Chen, Zijun ; Klimov, Paul V. ; et al ( December 2023 , Nature Physics)

   The leakage of quantum information out of the two computational states of a qubit into other energy states represents a major challenge for quantum error correction. During the operation of an error-corrected algorithm, leakage builds over time and spreads through multi-qubit interactions. This leads to correlated errors that degrade the exponential suppression of the logical error with scale, thus challenging the feasibility of quantum error correction as a path towards fault-tolerant quantum computation. Here, we demonstrate a distance-3 surface code and distance-21 bit-flip code on a quantum processor for which leakage is removed from all qubits in each cycle. This shortens the lifetime of leakage and curtails its ability to spread and induce correlated errors. We report a tenfold reduction in the steady-state leakage population of the data qubits encoding the logical state and an average leakage population of less than 1 × 10⁻³throughout the entire device. Our leakage removal process efficiently returns the system back to the computational basis. Adding it to a code circuit would prevent leakage from inducing correlated error across cycles. With this demonstration that leakage can be contained, we have resolved a key challenge for practical quantum error correction at scale.

    

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5. On the performance of particle filters with adaptive number of particles

   https://doi.org/10.1007/s11222-021-10056-0  

   Elvira, Víctor ; Miguez, Joaquín ; Djurić, Petar M. ( October 2021 , Statistics and Computing)

   We investigate the performance of a class of particle filters (PFs) that can automatically tune their computational complexity by evaluating online certain predictive statistics which are invariant for a broad class of state-space models. To be specific, we propose a family of block-adaptive PFs based on the methodology of Elvira et al. (IEEE Trans Signal Process 65(7):1781–1794, 2017). In this class of algorithms, the number of Monte Carlo samples (known asparticles) is adjusted periodically, and we prove that the theoretical error bounds of the PF actually adapt to the updates in the number of particles. The evaluation of the predictive statistics that lies at the core of the methodology is done by generatingfictitious observations, i.e., particles in the observation space. We study, both analytically and numerically, the impact of the numberKof these particles on the performance of the algorithm. In particular, we prove that if the predictive statistics withKfictitious observations converged exactly, then the particle approximation of the filtering distribution would match the firstKelements in a series of moments of the true filter. This result can be understood as a converse to some convergence theorems for PFs. From this analysis, we deduce an alternative predictive statistic that can be computed (for some models) without sampling any fictitious observations at all. Finally, we conduct an extensive simulation study that illustrates the theoretical results and provides further insights into the complexity, performance and behavior of the new class of algorithms.

    

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