Balasubramanian, K., Li, T., and Yuan, M. On the Optimality of Kernel-Embedding Based Goodness-of-Fit Tests. Retrieved from https://par.nsf.gov/biblio/10275791. Journal of machine learning research 22.
Balasubramanian, K., Li, T., & Yuan, M. On the Optimality of Kernel-Embedding Based Goodness-of-Fit Tests. Journal of machine learning research, 22 (). Retrieved from https://par.nsf.gov/biblio/10275791.
Balasubramanian, K., Li, T., and Yuan, M.
"On the Optimality of Kernel-Embedding Based Goodness-of-Fit Tests". Journal of machine learning research 22 (). Country unknown/Code not available. https://par.nsf.gov/biblio/10275791.
@article{osti_10275791,
place = {Country unknown/Code not available},
title = {On the Optimality of Kernel-Embedding Based Goodness-of-Fit Tests},
url = {https://par.nsf.gov/biblio/10275791},
abstractNote = {},
journal = {Journal of machine learning research},
volume = {22},
author = {Balasubramanian, K. and Li, T. and Yuan, M.},
editor = {null}
}
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