Lahiri, Jurick, Kline, Jessica, and Dantus, Marcos. Ultrafast pulse metrology for industrial applications. Retrieved from https://par.nsf.gov/biblio/10277428. Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XX . Web. doi:10.1117/12.2546754.

Lahiri, Jurick, Kline, Jessica, & Dantus, Marcos. Ultrafast pulse metrology for industrial applications. Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XX, (). Retrieved from https://par.nsf.gov/biblio/10277428. https://doi.org/10.1117/12.2546754

Lahiri, Jurick, Kline, Jessica, and Dantus, Marcos. "Ultrafast pulse metrology for industrial applications". Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XX (). Country unknown/Code not available. https://doi.org/10.1117/12.2546754. https://par.nsf.gov/biblio/10277428.

@article{osti_10277428,
place = {Country unknown/Code not available}, title = {Ultrafast pulse metrology for industrial applications}, url = {https://par.nsf.gov/biblio/10277428}, DOI = {10.1117/12.2546754}, abstractNote = {}, journal = {Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XX}, author = {Lahiri, Jurick and Kline, Jessica and Dantus, Marcos}, editor = {Herman, Peter R. and Meunier, Michel and Osellame, Roberto} }