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Title: Fast Physics-Based Electromigration Analysis for Full-Chip Networks by Efficient Eigenfunction-Based Solution
Award ID(s):
1816361 2007135
NSF-PAR ID:
10279537
Author(s) / Creator(s):
; ; ; ; ; ;
Date Published:
Journal Name:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume:
40
Issue:
3
ISSN:
0278-0070
Page Range / eLocation ID:
507 to 520
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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