Fast Physics-Based Electromigration Analysis for Full-Chip Networks by Efficient Eigenfunction-Based Solution
- NSF-PAR ID:
- 10279537
- Date Published:
- Journal Name:
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Volume:
- 40
- Issue:
- 3
- ISSN:
- 0278-0070
- Page Range / eLocation ID:
- 507 to 520
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation